方晨璐¹，李 超²，王 莹¹，孟茁越¹

（1.咸阳职业技术学院，西安712000；2.陕西省产品质量监督检验研究院，西安710048）

摘要：透射电子显微镜（TEM）具有可观察样品内部精细结构的优点，其分辨率可达到0.1～0.2nm，是研究淀粉微观结构的重要工具之一。该文对比了TEM、SEM和AFM三种淀粉表征手段在成像原理、样品制备、分辨率和不同技术的特点，并综述了近几年来TEM在淀粉微观颗粒及纳米结构研究中的应用，为分析不同淀粉微观纳米结构提供了参考。

关键词：透射电子显微镜；淀粉；微观结构

中图分类号：TS23 文献标识码：A 文章编号：1674-506X（2025）02-0118-0008

Application of Transmission Electron Microscope in the Study of Starch Microparticles and Nanostructures

FANG Chenlu¹, LI Chao², WANG Ying¹, MENG Zhuoyue¹

(1.Xianyang Polytechnic Institute, Xi’an 712000, China;

2.Shaanxi Institute of Product Quality Supervision and Inspection, Xi’an 710048, China)

Abstract: Transmission Electron Microscope (TEM) offers the advantage of observing the internal fine structures of samples, with a resolution capable of achieving 0.1~0.2 nm, making it one of the key tools for studying the microstructure of starch. This article compares the imaging principles, sample preparations, resolutions, and different technical characteristics of three starch characterization methods, namely Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM), and Atomic Force Microscopy (AFM). It also reviews the applications of TEM in the research on starch microparticles and nanostructures in recent years, provides a reference for the analysis of the micro-nanostructures of different starches.

Keywords: transmission electron microscopy; starch; microstructure

doi: 10.3969/j.issn.1674-506X.2025.02-016